Scanning Electron & Ion Microscopes
Scanning Electron Microscopes (SEM) Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) Multiple Ion Beam Microscopy Correlative Microscopy Upgrades
Scanning Electron & Ion Microscopes
Scanning Electron Microscopes (SEM) scan samples with focused electron beam and get images with information about the samples’ topography and composition.
CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from ZEISS deliver high resolution imaging and superior materials contrast.
Widely used in nanotechnology, materials research, life sciences, semiconductor, raw materials and industry.
Combine 3D imaging, analysis and material processing
Enjoy real-time interaction and perform imaging and milling simultaneously
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