Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM) Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) Multiple Ion Beam Microscopy Correlative Microscopy Upgrades
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Scanning Electron Microscopes
Scanning Electron Microscopes
(SEM)
(SEM)
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and get images with information about the samples’ topography and composition.
CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from ZEISS deliver high resolution imaging and superior materials contrast.
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